Items where Author is "Overney, R."

1994

Howald, L. and Luthi, R. and Meyer, E. and Gerth, G. and Haefke, H. G. and Overney, R. and Guntherodt, H. J.. (1994) Friction force microscopy on clean surfaces of NaCl, NaF, and AgBr. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 2227-2230.

Meyer, E. and Howald, L. and Luthi, R. and Haefke, H. and Ruetschi, M. and Bonner, T. and Overney, R. and Frommer, J. and Hofer, R. and Guntheroidt, H. J.. (1994) Scanning probe microscopy on the surface of Si(111). Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 2060-2063.

1993

Frommer, J. and Luthi, R. and Meyer, E. and Anselmetti, D. and Dreier, M. and Overney, R. and Guntherodt, H. J. and Fujihira, M.. (1993) Adsorption at domain edges. Nature, Vol. 364, H. 6434. p. 198.

Howald, L. and Meyer, E. and Luthi, R. and Haefke, H. and Overney, R. and Rudin, H. and Guntherodt, H. J.. (1993) Multifunctional probe microscope for facile operation in ultrahigh-vacuum. Applied physics letters, Vol. 63, H. 1. pp. 117-119.

Overney, R. and Meyer, E.. (1993) Tribological investigation using friction force microscopy. MRS bulletin, Vol. 18, H. 5. pp. 26-34.

1992

Schabert, F. and Hefti, A. and Goldie, K. and Stemmer, A. and Engel, A. and Meyer, E. and Overney, R. and Guntherodt, H. J.. (1992) Ambient-pressure scanning probe microscopy of 2D regular protein arrays. Ultramicroscopy, Vol. 42, Part B. pp. 1118-1124.

Howald, L. and Luthi, R. and Meyer, E. and Haefke, H. and Overney, R. and Gerth, G. and Rudin, H. and Guntherodt, H. J.. (1992) Bidirectional force microscope for surface-analysis in ultrahigh-vacuum. Helvetica physica acta, Vol. 65, H. 6. pp. 868-869.

Meyer, E. and Overney, R. and Brodbeck, D. and Howald, L. and Luthi, R. and Frommer, J. and Guntherodt, H. J.. (1992) Friction and wear of Langmuir-Blodgett films observed by friction force microscopy. Physical review letters, Vol. 69, H. 12. pp. 1777-1780.

Meyer, E. and Overney, R. and Luthi, R. and Brodbeck, D. and Howald, L. and Frommer, J. and Guntherodt, H. J. and Wolter, O. and Fujihira, M. and Takano, H. and Gotoh, Y.. (1992) Friction forc emicroscopy of mixed Langmuir-Blodgett films. Thin Solid Films, Vol. 220, H. 1-2. pp. 132-137.

Brodbeck, D. and Howald, L. and Luthi, R. and Meyer, E. and Overney, R.. (1992) Scan control and data acquisition for bidirectional force microscopy. Ultramicroscopy, Vol. 42, Part B. pp. 1580-1584.

Meyer, E. and Howald, L. and Overney, R. and Brodbeck, D. and Luthi, R. and Haefke, H. and Frommer, J. and Guntherodt, H. J.. (1992) Structure and dynamics of solid surfaces observed by atomic force microscopy. Ultramicroscopy, Vol. 42, Part A. pp. 274-280.

1991

Meyer, E. and Heinzelmann, H. and Brodbeck, D. and Overney, G. and Overney, R. and Howald, L. and HUG, H. and Jung, T. and Hidber, H. R. and Guntherodt, H. J.. (1991) Atomic resolution on the surface of LiF(100) by atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 9, H. 2, Part 2. pp. 1329-1332.